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Thermal Shock Chamber

Thermal shock chamber is in a variety of environmental tests, one of the common equipment, suitable for electronic instruments, materials, electricians, vehicles, metal, aviation products, electronic products, etc.

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Description

Thermal shock chamber is in a variety of environmental tests, one of the common equipment, suitable for electronic instruments

Core Parameters

Thermal Shock Chamber CZ-A-1080G Technical parameter
Model	CZ-A-1080G
Inner Dimension WxHxD(mm)	1000x1000x1080
Outer Dimension WxHxD(mm)	1800x2250x2100
Temperature Range	-70℃～+150℃
Humidity Range	20%～98%R.H.(10%-98%R.H/5%～98%R.H is special customized)
Temperature Humidity Resolution/Uniformity	0.01℃；0.1%R.H./±2.0℃；±3.0%R.H.
Temperature Humidity Control Accuracy/Fluctuation	±1.0℃；±2.0%R.H./±0.5℃；±2.0%R.H.
Heating Rate	—55℃→+90℃ heating rate is linear 10℃/min(no load)
Cooling Rate	90℃→ -55℃ heating rate is linear 10℃/min(no load)
Inner/Outer Material	Inner material is SUS304# stainless steel, Outer material is cold-rolled steel plate with paint treatment
Insulation Material	High temperature resistant high-density polyester amine hard foam insulator material
Cooling System	Cooling method/ Double stage compressor
Protection Device	Compressor overload protection switch, Refrigerant high low pressure protection switch, Over temperature protection switch, Fuse, Fault warning system
Spare Parts	View Window, Test Hole, Shelf, Gauze
Controller	Korea Samwon or Other Brand
Compressor	France Tecumseh or Germany Bitzer
Power	3Φ380VAC±10%50/60Hz

Product meets test conditions and implementation standards

1. GJB150.5A-2009 Temperature shock test

2. GB/2423.22-2012/IEC 60068-2-14: 2009 Temperature shock test

3. GB/T 2424.13-2002 / IEC 60068-2-33: 1971 Electronic product environmental test Part 2: Test method Temperature change test guide

3. GJB360B-2009 Temperature shock test

(IEC6008-2-1-2007 Electrical electronics environmental test Part 2: Test method test A: low temperature

5. GB/T 2423.2-2008 / IEC60068-2-2-2008 / IEC60068-2-2-2: 2007 Electrical Electronic Product Environment Test Part 2: Test Method Test B: High Temperature

6. GB/T 10589-2008 Low Temperature Test Chamber Technical Conditions

7. GB/T 11158-2008 High temperature test chamber technical conditions

8. MIL-STD-883, JIS C 60068-2-14, JASO-D001, AEC-Q101 Temperature cycle test;